Scanning probe microscopy in modern nanotechnology

	Symposium Organizer Igor Sokolov Clarkson University Contact email

Scanning Probe microscopy (SPM) is one of the (if not the) major tools responsible for the development of what is called nowadays Nanoscience and Nanotechnology. The AFM has a unique combination of 3D resolution, ease of operation, and a broad range of samples it can work with. Recently, a whole spectrum of SPM techniques has been developed to study surfaces beyond just simple imaging. Measuring interaction forces between a surface and a sharp SPM probe, one can collect information on electrical, magnetic properties, thermal conductivity, elasticity, and chemical structure of the surface down to the nanoscale resolution.

Technical Program

Sunday pm: Scanning Probe Microscopy In Modern Nanotechnology I
Monday am: Scanning Probe Microscopy In Modern Nanotechnology II
Monday pm; SPM In Modern Nanotechnology: Posters

Invited Speakers

	Nancy Burnham Worcester Polytechnic Institute		Todd Gross University of New Hampshire
	Stefan Zauscher Duke		Alexei Gruverman University of Nebraska, Lincoln
	Alexander J. Malkin Lawrence Livermore National Laboratory		Peter Maksymovych Oak Ridge National Laboratory
	Gilbert Min Agilent